Beilstein J. Nanotechnol.2020,11, 1272–1279, doi:10.3762/bjnano.11.111
integration.
Keywords: atomic force microscopy (AFM); combinedsetup; correlative microscopy; helium ion microscopy (HIM); self-sensing cantilevers; Introduction
Shortly after the invention of the atomic force microscope (AFM) in 1986 [1], efforts were made towards combining this scanning probe microscopy
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Figure 1:
AFM assembly and integration inside a Zeiss ORION NanoFab helium ion microscope. a) Simplified CAD ...